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Effects of voltage ripple and current mode on diagnostic x‐ray spectra and exposures
Author(s) -
Matsumoto Masao,
Kubota Hideaki,
Hayashi Hideki,
Kanamori Hitoshi
Publication year - 1991
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.596736
Subject(s) - ripple , spectral line , fluence , voltage , atomic physics , energy (signal processing) , photon energy , optics , computational physics , physics , photon , materials science , laser , quantum mechanics
The voltage‐ripple dependence relationship on x‐ray energy‐spectral values (energy fluence per unit interval of photon energy) and exposures at 70‐kV peak were obtained theoretically by using the semiempirical formula of emission spectra given by Birch and Marshall [Phys. Med. Biol. 24 , 505 (1979)]. The calculations were performed with and without various thicknesses of aluminum. As the ripple increases, the energy‐spectral values decrease as expected. When the ripple is large, however, energy‐spectral values (per mAs) take the minimum values; therefore, the exposure (per mAs) also reaches the minimum value for the unsaturating current modes, contrary to expectation. The reasons for this phenomenon were clarified. Exposures clearly take the minimum value in 2‐pulse units. This phenomenon was experimentally verified.