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Exposure uniformity considerations in slit radiography
Author(s) -
King Michael A.,
Barnes Gary T.
Publication year - 1983
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.595372
Subject(s) - slit , optics , artifact (error) , transmittance , radiography , convolution (computer science) , physics , materials science , computer science , computer vision , artificial intelligence , nuclear physics , artificial neural network
Slit radiography is a highly efficient means of suppressing scatter. However, when employed with a pulsating x‐ray source, a grid line type of artifact results if the movement of the slit is not properly coupled to the periodicity of the source. Taking the exposure of the film to be the convolution of the slit transmittance and the radiation intensity, the conditions for a uniform exposure have been derived for the realistic configuration of a multiple‐slit array and a slit transmittance that includes the focal spot and slit geometry. Expressions for the amplitude and spatial frequency of the artifact when the conditions are not met are derived. Methods of suppressing the artifact when its vanishing conditions are not met are also discussed.