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Spectroscopy of diagnostic x rays by a Compton‐scatter method
Author(s) -
Yaffe M.,
Taylor K. W.,
Johns H. E.
Publication year - 1976
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.594263
Subject(s) - spectrometer , germanium , compton scattering , optics , spectral line , photon , physics , spectroscopy , x ray spectroscopy , range (aeronautics) , semiconductor detector , resolution (logic) , materials science , detector , silicon , optoelectronics , quantum mechanics , astronomy , artificial intelligence , computer science , composite material
A method is described for measuring the energy spectra of diagnostic x rays using a high‐resolution intrinsic germanium spectrometer. The method is applicable over the wide range of x‐ray exposure rates normally used in radiography. Reduction of the high x‐ray beam intensity to a level acceptable to the germanium spectrometer is achieved by measuring the spectrum of photons scattered through 90° by a lucite disc. From this measured spectrum the primary spectrum is obtained by calculation. Some typical x‐ray spectra are presented.