In-situ diagnostics on fs-laser induced modification of glasses for selective etching
Author(s) -
M.E.A. Hermans,
Jens Gottmann,
Anna Schiffer
Publication year - 2012
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.912765
Subject(s) - materials science , laser , optics , interferometry , refractive index , etching (microfabrication) , absorption (acoustics) , optoelectronics , optical path length , microscope , optical path , in situ , radiation , isotropic etching , nanotechnology , composite material , chemistry , physics , organic chemistry , layer (electronics)
In-situ observation of the in-volume modification of glasses by focused ultra-short pulsed laser radiation with an interferometer microscope allows for the spatially resolved measurement of the transient optical path difference (OPD) in the surrounding of the laser-induced modification. By the relation of refractive index and temperature an estimation of temperature during modification process is possible. The absorption of the laser radiation is measured and is, together with the estimation of processing temperature during modification, a first step towards a process model for the induced modifications of the transparent material
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