Development, characterization and experimental performance of x-ray optics for the LCLS free-electron laser
Author(s) -
Regina Soufli,
M. J. Pivovaroff,
Sherry L. Baker,
Jeffrey C. Robinson,
Eric M. Gullikson,
T. McCarville,
P.M. Stefan,
Andrew Aquila,
J. Ayers,
M. A. McKernan,
R. M. Bionta
Publication year - 2008
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.796876
Subject(s) - x ray optics , optics , metrology , linear particle accelerator , free electron laser , laser , materials science , silicon carbide , characterization (materials science) , silicon , surface metrology , physics , surface roughness , optoelectronics , beam (structure) , x ray , profilometer , metallurgy , composite material
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