Open AccessReliability shortcomings for micronanotechnology-based systems
Author(s) -
Ernest J. Garcia,
Marc A. Polosky
Publication year - 2007
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.721251
Subject(s) - reliability engineering , reliability (semiconductor) , computer science , engineering , physics , power (physics) , quantum mechanics
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