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Electron spectro-microscopy of 2D materials
Author(s) -
Jerzy T. Sadowski
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2568816
Subject(s) - low energy electron microscopy , characterization (materials science) , materials science , nanotechnology , synchrotron , microscopy , van der waals force , electron microscope , nanometre , monolayer , epitaxy , atomic units , optics , chemistry , physics , layer (electronics) , composite material , organic chemistry , molecule , quantum mechanics

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