Determination of background doping type in type-II superlattice using capacitance-voltage measurements with double mesa structure | Zendy

D. R. Fink | Zendy; Seunghyun Lee | Zendy; S. H. Kodati | Zendy; Vinita Dahiya | Zendy; Theodore J. Ronningen | Zendy; M. Winslow | Zendy; C. H. Grein | Zendy; Andrew H. Jones | Zendy; Joe C. Campbell | Zendy; John F. Klem | Zendy; Sanjay Krishna | Zendy

Open Access

Determination of background doping type in type-II superlattice using capacitance-voltage measurements with double mesa structure

Author(s) -

D. R. Fink,

Seunghyun Lee,

S. H. Kodati,

Vinita Dahiya,

Theodore J. Ronningen,

M. Winslow,

C. H. Grein,

Andrew H. Jones,

Joe C. Campbell,

John F. Klem,

Sanjay Krishna

Publication year - 2020

Publication title -

osti oai (u.s. department of energy office of scientific and technical information)

Language(s) - English

Resource type - Conference proceedings

DOI - 10.1117/12.2557105

Subject(s) - doping , superlattice , capacitance , monolayer , materials science , polarity (international relations) , substrate (aquarium) , optoelectronics , semiconductor , conductivity , voltage , condensed matter physics , analytical chemistry (journal) , electrical engineering , chemistry , nanotechnology , electrode , physics , biochemistry , oceanography , engineering , chromatography , geology , cell

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