Open AccessAn in-situ millimeter-wave diagnostic for droplet characterization during jetting-based additive manufacturing processes
Author(s) -
Tammy Chang,
Rayford O. Mays,
Saptarshi Mukherjee,
Nicholas N. Watkins,
Andrew J. Pascall,
Jason R. Jeffries,
Joseph W. Tringe
Publication year - 2020
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2547937
Subject(s) - characterization (materials science) , fabrication , extremely high frequency , millimeter , materials science , in situ , electrical impedance , process (computing) , computer science , nanotechnology , optoelectronics , acoustics , optics , engineering , electrical engineering , telecommunications , physics , meteorology , medicine , alternative medicine , pathology , operating system
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