Open AccessHard x-ray nanoprobe: a scanning hard x-ray microscopy beamline offering multi-modal imaging capabilities at 10 nm
Author(s) -
Hanfei Yan,
Xiaojing Huang,
Yong S. Chu,
Ajith Pattammattel,
Evgeny Nazaretski,
Petr Ill
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2531196
Subject(s) - beamline , nanoprobe , optics , synchrotron , materials science , microscopy , synchrotron radiation , image resolution , nanotechnology , physics , fluorescence , beam (structure)
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