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X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions
Author(s) -
Evgeny Nazaretski,
Weihe Xu,
Hanfei Yan,
Xiaojing Huang,
Wei Xu,
Nathalie Bouet,
Juan Zhou,
David Scott Coburn,
Ivan Lee,
Mingyuan Ge,
Lei Huang,
Mourad Idir,
Yong S. Chu
Publication year - 2019
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2528166
Subject(s) - microscope , instrumentation (computer programming) , characterization (materials science) , microscopy , optics , image resolution , materials science , ptychography , nanotechnology , computer science , physics , diffraction , operating system

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