Open AccessExtensive microstructural quality control inside a machine tool using multiwavelength digital holography
Author(s) -
Rainer Börret,
Viktor Grün,
Jörg Seewig,
Felix Ströer,
Tobias Seyler,
Markus Fratz,
Tobias Beckmann,
Alexander Bertz,
Daniel Carl
Publication year - 2018
Publication title -
fraunhofer-publica (fraunhofer-gesellschaft)
Language(s) - Uncategorized
Resource type - Conference proceedings
DOI - 10.1117/12.2319750
Subject(s) - machine tool , interferometry , computer science , holography , optics , coordinate measuring machine , holographic interferometry , metrology , astronomical interferometer , artificial intelligence , mechanical engineering , physics , engineering
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