Open AccessReliability testing of ultra-low noise InGaAs quad photoreceivers
Author(s) -
Abhay Joshi,
Shubhashish Datta,
Narasimha S. Prasad,
M. Sivertz
Publication year - 2018
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2293010
Subject(s) - materials science , photodiode , capacitance , ranging , optoelectronics , indium gallium arsenide , noise (video) , optics , gallium arsenide , electrode , physics , computer science , telecommunications , quantum mechanics , artificial intelligence , image (mathematics)
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