Solid state streak camera prototype electronic performance testing and characterization
Author(s) -
John Stahoviak,
Vu Tran,
Alicia Alarie,
D. Max,
Y. P. Opachich,
Lawrence MacNeil,
J. L. Porter,
Quinn Looker,
Caleb Wolf,
Thomas B. Waltman,
Mark Kimmel,
Joel Long
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2276224
Subject(s) - streak , streak camera , microsecond , characterization (materials science) , computer science , calibration , detector , nanosecond , large format , image resolution , diode , electrical engineering , optics , physics , laser , engineering , artificial intelligence , telecommunications , quantum mechanics
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