z-logo
open-access-imgOpen Access
Leveraging multi-channel x-ray detector technology to improve quality metrics for industrial and security applications
Author(s) -
Edward S. Jimenez,
Kyle R. Thompson,
Ryan N. Goodner,
Adriana Stohn
Publication year - 2017
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1117/12.2275850
Subject(s) - computer science , detector , artificial intelligence , segmentation , grayscale , data acquisition , artifact (error) , channel (broadcasting) , computer vision , projection (relational algebra) , noise (video) , pixel , image quality , telecommunications , image (mathematics) , algorithm , operating system

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom