Open AccessHigh-contrast 3D image acquisition using HiLo microscopy with an electrically tunable lens
Author(s) -
Katrin Philipp,
André Smolarski,
Andreas Fischer,
Nektarios Koukourakis,
Moritz Stürmer,
Ulrike Wallrabe,
Jürgen Czarske
Publication year - 2016
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2225596
Subject(s) - lens (geology) , materials science , optics , microscope , polydimethylsiloxane , microscopy , resolution (logic) , optical microscope , image resolution , confocal , scanning electron microscope , computer science , physics , nanotechnology , artificial intelligence
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