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Hierarchical multi-scale approach to validation and uncertainty quantification of hyper-spectral image modeling
Author(s) -
Dave Engel,
Thomas A. Reichardt,
Thomas J. Kulp,
David L. Graff,
Sandra E. Thompson
Publication year - 2016
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2224262
Subject(s) - reliability (semiconductor) , computer science , process (computing) , scale (ratio) , uncertainty quantification , component (thermodynamics) , model validation , hierarchical database model , machine learning , data mining , power (physics) , physics , quantum mechanics , thermodynamics , operating system , data science

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