Depth determination of critical fluence-limiting defects within planarized and non-planarized mirror coatings | Zendy

Christopher J. Stolz | Zendy; Justin Wolfe | Zendy; Paul B. Mirkarimi | Zendy; James A. Folta | Zendy; John J. Adams | Zendy; Marlon G. Menor | Zendy; Rajesh N. Raman | Zendy; Norm Neilsen | Zendy; Mary A. Norton | Zendy; Ronald L. Luthi | Zendy; Nick E. Teslich | Zendy; Carmen S. Mei | Zendy; Dinesh Patel | Zendy

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Depth determination of critical fluence-limiting defects within planarized and non-planarized mirror coatings

Author(s) -

Christopher J. Stolz,

Justin Wolfe,

Paul B. Mirkarimi,

James A. Folta,

John J. Adams,

Marlon G. Menor,

Rajesh N. Raman,

Norm Neilsen,

Mary A. Norton,

Ronald L. Luthi,

Nick E. Teslich,

Carmen S. Mei,

Dinesh Patel

Publication year - 2015

Publication title -

proceedings of spie, the international society for optical engineering/proceedings of spie

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.192

H-Index - 176

eISSN - 1996-756X

pISSN - 0277-786X

DOI - 10.1117/12.2197349

Subject(s) - materials science , fluence , chemical mechanical planarization , coating , stack (abstract data type) , optical coating , optics , optoelectronics , laser , limiting , substrate (aquarium) , interference (communication) , polishing , composite material , computer science , physics , mechanical engineering , computer network , channel (broadcasting) , oceanography , geology , programming language , engineering

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