Open AccessThe role of film interfaces in near-ultraviolet absorption and pulsed-laser damage in ion-beam-sputtered coatings based on HfO2/SiO2thin-film pairs
Author(s) -
S. Papernov,
А. А. Козлов,
J. B. Oliver,
C. Smith,
Lars Jensen,
Detlev Ristau,
Stefan Günster,
H. Mädebach
Publication year - 2015
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2196654
Subject(s) - materials science , thin film , absorption (acoustics) , layer (electronics) , pulsed laser deposition , analytical chemistry (journal) , optical coating , absorption spectroscopy , ion beam , optics , beam (structure) , composite material , nanotechnology , chemistry , physics , chromatography
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