Open AccessCross-linking characterization of polymers based on their optical dispersion utilizing a white-light interferometer
Author(s) -
Ch. Taudt,
Tobias Baselt,
Gernot Oreški,
C. Hirschl,
Edmund Koch,
Péter Hartmann
Publication year - 2015
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2184814
Subject(s) - interferometry , materials science , white light interferometry , dispersion (optics) , curing (chemistry) , characterization (materials science) , polymer , optics , white light , computer science , optoelectronics , composite material , nanotechnology , physics
This work analyses samples of the widely used encapsulant of photovoltaics modules, ethylene vinyl acetate (EVA). The samples were cross-linked using a lamination technique for different curing times (0 - 20 minutes). The cross-linking characterization is done by determinating the material dispersion with the aid of a combined temporal- and spectral domain white-light interferometer. With the proposed technique it was possible to discriminate the differences in crosslinking for the given curing times. One important feature of this approach is the possibility to perform space resolved measurements of the crosslinking state with μm-resolution. Furthermore the paper discusses the mathematical analysis and processing of measurement data and shows a prototype solution for the fast and automated data acquisition for industrial application
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