Oxidation/reduction reactions at the metal contact-TlBr interface: an x-ray photoelectron spectroscopy study
Author(s) -
A. J. Nelson,
E. Swanberg,
Lars F. Voss,
R. T. Graff,
Adam Conway,
Rebecca J. Nikolić,
Sheila Payne,
H. Kim,
L. Cirignano,
K.S. Shah
Publication year - 2014
Publication title -
proceedings of spie, the international society for optical engineering/proceedings of spie
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.192
H-Index - 176
eISSN - 1996-756X
pISSN - 0277-786X
DOI - 10.1117/12.2062037
Subject(s) - x ray photoelectron spectroscopy , materials science , heterojunction , analytical chemistry (journal) , metal , single crystal , photoemission spectroscopy , x ray spectroscopy , spectroscopy , optoelectronics , crystallography , chemical engineering , chemistry , metallurgy , physics , chromatography , quantum mechanics , engineering
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