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Using deep learning for pixel-defect corrections in flat-panel radiography imaging
Author(s) -
Eunae Lee,
Eunyeong Hong,
Dong Sik Kim
Publication year - 2021
Publication title -
journal of medical imaging
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.779
H-Index - 29
eISSN - 2329-4310
pISSN - 2329-4302
DOI - 10.1117/1.jmi.8.2.023501
Subject(s) - pixel , convolutional neural network , artificial intelligence , deep learning , computer science , detector , image quality , algorithm , artificial neural network , pattern recognition (psychology) , image (mathematics) , telecommunications

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