Open AccessDescription of versatile optical polarimetric scatterometer that measures all 16 elements of the Mueller matrix for reflection and transmission: application to measurements of scatter cross sections, ellipsometric parameters, optical activity, and the complex chiral parameters
Author(s) -
Robert D. Kubik
Publication year - 2008
Publication title -
optical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.357
H-Index - 105
eISSN - 1560-2303
pISSN - 0091-3286
DOI - 10.1117/1.2979232
Subject(s) - mueller calculus , scatterometer , polarimetry , optics , backscatter (email) , scattering , matrix (chemical analysis) , light scattering , polarization (electrochemistry) , optical rotation , reflection (computer programming) , physics , materials science , radar , computer science , telecommunications , chemistry , composite material , wireless , programming language
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom