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Effect of probe geometry during measurement of >100 A Ga2O3 vertical rectifiers
Author(s) -
Rajnikant Sharma,
Minghan Xian,
Chaker Fares,
Mark E. Law,
Marko J. Tadjer,
Karl D. Hobart,
F. Ren,
S. J. Pearton
Publication year - 2020
Publication title -
journal of vacuum science and technology. a. vacuum, surfaces, and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/6.0000815
Subject(s) - rectifier (neural networks) , current (fluid) , solver , schottky diode , fabrication , electrical engineering , voltage , current density , power (physics) , materials science , optoelectronics , physics , computer science , engineering , diode , medicine , stochastic neural network , alternative medicine , pathology , quantum mechanics , machine learning , recurrent neural network , artificial neural network , programming language