Open AccessSample handling, preparation and mounting for XPS and other surface analytical techniques
Author(s) -
F. A. Stevie,
R. Garcia,
Jeffrey R. Shallenberger,
John G. Newman,
Carrie L. Donley
Publication year - 2020
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/6.0000421
Subject(s) - x ray photoelectron spectroscopy , sample (material) , sample preparation , range (aeronautics) , materials science , nanotechnology , computer science , analytical chemistry (journal) , chemistry , engineering , chemical engineering , chromatography , composite material
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