Open AccessIntroductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
Author(s) -
Mark Engelhard,
Donald R. Baer,
Alberto HerreraGómez,
Peter M. A. Sherwood
Publication year - 2020
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/6.0000359
Subject(s) - x ray photoelectron spectroscopy , auger , spectral line , intensity (physics) , analytical chemistry (journal) , computer science , computational physics , chemistry , optics , physics , atomic physics , nuclear magnetic resonance , astronomy , chromatography
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom