Thickness dependence of infrared lattice absorption and excitonic absorption in ZnO layers on Si and SiO2 grown by atomic layer deposition | Zendy

Nuwanjula S. Samarasingha | Zendy; Stefan Zollner | Zendy; Dipayan Pal | Zendy; Rinki Singh | Zendy; Sudeshna Chattopadhyay | Zendy

Open Access

Thickness dependence of infrared lattice absorption and excitonic absorption in ZnO layers on Si and SiO2 grown by atomic layer deposition

Author(s) -

Nuwanjula S. Samarasingha,

Stefan Zollner,

Dipayan Pal,

Rinki Singh,

Sudeshna Chattopadhyay

Publication year - 2020

Publication title -

journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.429

H-Index - 119

eISSN - 2166-2754

pISSN - 2166-2746

DOI - 10.1116/6.0000184

Subject(s) - materials science , blueshift , band gap , dielectric , exciton , thin film , ellipsometry , atomic layer deposition , absorption (acoustics) , lattice constant , potential well , ultraviolet , phonon , condensed matter physics , molecular physics , optoelectronics , photoluminescence , optics , nanotechnology , chemistry , diffraction , composite material , physics

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research