Atomic layer deposition of HfO2 films using carbon-free tetrakis(tetrahydroborato)hafnium and water
Author(s) -
Devika Choudhury,
David J. Mandia,
Ryan R. Langeslay,
Angel YanguasGil,
Steven Letourneau,
Alfred P. Sattelberger,
Mahalingam Balasubramanium,
Anil U. Mane,
Massimiliano Delferro,
Jeffrey W. Elam
Publication year - 2020
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/6.0000053
Subject(s) - analytical chemistry (journal) , ellipsometry , hafnium , thin film , amorphous solid , x ray photoelectron spectroscopy , materials science , fourier transform infrared spectroscopy , atomic layer deposition , quartz crystal microbalance , x ray reflectivity , chemistry , zirconium , crystallography , chemical engineering , nanotechnology , adsorption , chromatography , engineering , metallurgy
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