Structure and optical characterization of ZnxCd1−xTe thin films prepared by the close spaced vapor transport method | Zendy

J. GonzálezHernández | Zendy; O. Zelaya | Zendy; J. G. Mendoza-Alverez | Zendy; E. LópezCruz | Zendy; D. A. Pawlik | Zendy; David D. Allred | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Structure and optical characterization of ZnxCd1−xTe thin films prepared by the close spaced vapor transport method

Author(s) -

J. GonzálezHernández,

O. Zelaya,

J. G. Mendoza-Alverez,

E. LópezCruz,

D. A. Pawlik,

David D. Allred

Publication year - 1991

Publication title -

journal of vacuum science and technology a vacuum surfaces and films

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.583

H-Index - 112

eISSN - 1520-8559

pISSN - 0734-2101

DOI - 10.1116/1.577407

Subject(s) - scanning electron microscope , thin film , cadmium zinc telluride , analytical chemistry (journal) , materials science , photoluminescence , argon , substrate (aquarium) , cadmium telluride photovoltaics , chemical vapor deposition , zinc , diffraction , x ray crystallography , crystallography , chemistry , optics , optoelectronics , nanotechnology , metallurgy , composite material , physics , oceanography , organic chemistry , chromatography , detector , geology

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research