Advanced modeling of field enhanced thermionic emission
Author(s) -
Jonathan Edelen,
Nathan Cook,
Christopher Hall,
Yuan Hu,
Xi Tan,
Jean-Luc Vay
Publication year - 2020
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5140753
Subject(s) - thermionic emission , field electron emission , range (aeronautics) , computational physics , field (mathematics) , computer science , computational science , cathode , weighting , space charge , electric field , convergence (economics) , materials science , physics , electron , electrical engineering , engineering , mathematics , quantum mechanics , acoustics , pure mathematics , economic growth , economics , composite material
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