Open AccessEtching sharp tips from thin metallic wires for tuning-fork-based scanning probe microscopy
Author(s) -
Patrick Krantz,
Venkat Chandrasekhar
Publication year - 2020
Publication title -
journal of vacuum science and technology. b, nanotechnology and microelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5132848
Subject(s) - scanning tunneling microscope , materials science , etching (microfabrication) , tuning fork , scanning probe microscopy , tungsten , nanotechnology , optoelectronics , scanning electron microscope , composite material , metallurgy , layer (electronics) , physics , quantum mechanics , vibration