Open Access2D topological insulator bismuth selenide analyzed by in situ XPS
Author(s) -
Xinglu Wang,
Christopher M. Smyth,
Ava Khosravi,
Christopher R. Cormier,
Jeffrey R. Shallenberger,
Rafik Addou,
Robert M. Wallace
Publication year - 2019
Publication title -
surface science spectra
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.474
H-Index - 13
eISSN - 1520-8575
pISSN - 1055-5269
DOI - 10.1116/1.5130891
Subject(s) - x ray photoelectron spectroscopy , topological insulator , selenide , bismuth , semimetal , analytical chemistry (journal) , materials science , spectral line , fermi level , valence (chemistry) , band gap , chemistry , electron , condensed matter physics , selenium , optoelectronics , nuclear magnetic resonance , physics , organic chemistry , chromatography , astronomy , quantum mechanics , metallurgy
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