Open AccessSamarium thin films molecular plated from N,N-dimethylformamide characterized by XPS
Author(s) -
Kristian Myhre,
Jordan C. Delashmitt,
Nathan Sims,
Shelley M. Van Cleve,
R. A. Boll
Publication year - 2018
Publication title -
surface science spectra
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.474
H-Index - 13
eISSN - 1520-8575
pISSN - 1055-5269
DOI - 10.1116/1.5052011
Subject(s) - samarium , x ray photoelectron spectroscopy , dimethylformamide , carbon fibers , materials science , analytical chemistry (journal) , spectral line , thin film , resolution (logic) , chemistry , nanotechnology , inorganic chemistry , nuclear magnetic resonance , physics , organic chemistry , astronomy , artificial intelligence , solvent , composite number , computer science , composite material
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