Open AccessSamarium thin films molecular plated from N,N-dimethylformamide characterized by XPS
Author(s) -
Kristian Myhre,
Jordan C. Delashmitt,
Nathan Sims,
S. M. Van Cleve,
R. A. Boll
Publication year - 2018
Publication title -
surface science spectra online/surface science spectra
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.474
H-Index - 13
eISSN - 1520-8575
pISSN - 1055-5269
DOI - 10.1116/1.5052011
Subject(s) - samarium , x ray photoelectron spectroscopy , carbon fibers , dimethylformamide , materials science , analytical chemistry (journal) , spectral line , thin film , resolution (logic) , high resolution , chemistry , nanotechnology , nuclear magnetic resonance , inorganic chemistry , organic chemistry , physics , remote sensing , astronomy , artificial intelligence , solvent , geology , composite number , computer science , composite material