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Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides
Author(s) -
Scott Donald,
Jeff A. Stanford,
William McLean,
A. J. Nelson
Publication year - 2018
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.5021587
Subject(s) - auger electron spectroscopy , plutonium , auger , analytical chemistry (journal) , spectral line , spectroscopy , chemistry , oxide , metal , atomic physics , radiochemistry , physics , nuclear physics , organic chemistry , chromatography , astronomy , quantum mechanics

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