Open AccessToward understanding weak matrix effects in TOF SIMS
Author(s) -
Lev D. Gelb,
Amy V. Walker
Publication year - 2018
Publication title -
journal of vacuum science and technology. b, nanotechnology and microelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5019682
Subject(s) - mass spectrometry , secondary ion mass spectrometry , matrix (chemical analysis) , mass spectrometry imaging , chemistry , analyte , ion suppression in liquid chromatography–mass spectrometry , analytical chemistry (journal) , ion , yield (engineering) , characterization (materials science) , biological system , nanotechnology , materials science , tandem mass spectrometry , chromatography , metallurgy , biology , organic chemistry