Open AccessToF-SIMS analysis of ion implanted standard to quantify insecticide in mosquito netting with cesium and argon gas cluster sputtering beams
Author(s) -
Chuanzhen Zhou,
F. A. Stevie,
Stephen C. Smith,
Derk Rading,
Julia Zakel
Publication year - 2018
Publication title -
journal of vacuum science and technology. b, nanotechnology and microelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5011751
Subject(s) - sputtering , secondary ion mass spectrometry , netting , argon , analytical chemistry (journal) , static secondary ion mass spectrometry , chemistry , ion , materials science , ion implantation , ion beam , nanotechnology , environmental chemistry , thin film , organic chemistry , political science , law
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