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Thermoelectric and optical properties of advanced thermoelectric devices from Ni/Bi2Te3/Ni and Ni/Sb2Te3/Ni thin films
Author(s) -
S. Budak,
Zhigang Xiao,
Jorden Cole,
Dennis Price,
Tyler Davis,
Tiara Strong,
М. А. Алим
Publication year - 2017
Publication title -
journal of vacuum science and technology. b, nanotechnology and microelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.5001046
Subject(s) - thin film , materials science , seebeck coefficient , thermoelectric effect , annealing (glass) , scanning electron microscope , electrical resistivity and conductivity , sputter deposition , analytical chemistry (journal) , sputtering , optoelectronics , metallurgy , thermal conductivity , nanotechnology , composite material , chemistry , electrical engineering , physics , engineering , chromatography , thermodynamics

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