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Epitaxial SrRuO3/SrTiO3(100) analyzed using x-ray photoelectron spectroscopy
Author(s) -
David Eitan Barlaz,
Richard T. Haasch,
Edmund G. Seebauer
Publication year - 2017
Publication title -
surface science spectra online/surface science spectra
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.474
H-Index - 13
eISSN - 1520-8575
pISSN - 1055-5269
DOI - 10.1116/1.4999599
Subject(s) - x ray photoelectron spectroscopy , analytical chemistry (journal) , spectral line , auger electron spectroscopy , epitaxy , single crystal , photoelectric effect , auger , materials science , chemistry , crystallography , atomic physics , nuclear magnetic resonance , nanotechnology , physics , layer (electronics) , optoelectronics , chromatography , astronomy , nuclear physics

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