Current relaxation analysis in AlGaN/GaN high electron mobility transistors
Author(s) -
A. Y. Polyakov,
N. B. Smirnov,
Ivan Shchemerov,
InHwan Lee,
Taehoon Jang,
А. А. Дорофеев,
Nadezhda B. Gladysheva,
E. S. Kondratyev,
Yulia A. Turusova,
R. A. Zinovyev,
Andrei V. Turutin,
F. Ren,
S. J. Pearton
Publication year - 2017
Publication title -
journal of vacuum science and technology b nanotechnology and microelectronics materials processing measurement and phenomena
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.429
H-Index - 119
eISSN - 2166-2754
pISSN - 2166-2746
DOI - 10.1116/1.4973973
Subject(s) - logarithm , transistor , relaxation (psychology) , materials science , gaussian , exponential function , electron , ionization , spectral line , exponential decay , homogeneous broadening , optoelectronics , current (fluid) , transient (computer programming) , computational physics , condensed matter physics , molecular physics , doppler broadening , physics , quantum mechanics , voltage , mathematics , mathematical analysis , psychology , social psychology , ion , thermodynamics , computer science , operating system
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