
XPS and SIMS study of the surface and interface of aged C+ implanted uranium
Author(s) -
Scott B. Donald,
Wigbert J. Siekhaus,
A. J. Nelson
Publication year - 2016
Publication title -
journal of vacuum science and technology. a. vacuum, surfaces, and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.4962386
Subject(s) - x ray photoelectron spectroscopy , secondary ion mass spectrometry , uranium , surface layer , analytical chemistry (journal) , carbide , crystallite , valence (chemistry) , materials science , ion , metal , layer (electronics) , chemistry , metallurgy , chemical engineering , nanotechnology , environmental chemistry , organic chemistry , engineering