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XPS and SIMS study of the surface and interface of aged C+ implanted uranium
Author(s) -
Scott Donald,
W. J. Siekhaus,
A. J. Nelson
Publication year - 2016
Publication title -
journal of vacuum science and technology a vacuum surfaces and films
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.583
H-Index - 112
eISSN - 1520-8559
pISSN - 0734-2101
DOI - 10.1116/1.4962386
Subject(s) - x ray photoelectron spectroscopy , secondary ion mass spectrometry , uranium , surface layer , analytical chemistry (journal) , carbide , crystallite , valence (chemistry) , materials science , ion , metal , layer (electronics) , chemistry , metallurgy , chemical engineering , nanotechnology , environmental chemistry , organic chemistry , engineering

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