Open AccessCharacterization of HOPG, Sputtered HPOG and Graphene by ToF-SIMS and XPS
Author(s) -
Chak K. Chan,
Wenjing Xie,
LuTao Weng,
Kai Mo Ng
Publication year - 2016
Publication title -
proceedings of the world congress on recent advances in nanotechnology
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.104
H-Index - 2
ISSN - 2371-5308
DOI - 10.11159/icnei16.103
Subject(s) - x ray photoelectron spectroscopy , graphene , materials science , characterization (materials science) , sputtering , analytical chemistry (journal) , nanotechnology , chemistry , nuclear magnetic resonance , thin film , physics , chromatography