Open AccessReliability of Electronic Drivers: An Industrial Approach
Author(s) -
P. Watté,
G. van Hees,
Rab Roy Engelen,
W.D. van Driel
Publication year - 2021
Publication title -
research repository (delft university of technology)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1115/ipack2021-72293
Subject(s) - reliability (semiconductor) , electronics , field (mathematics) , reliability engineering , computer science , witness , order (exchange) , engineering , electrical engineering , business , power (physics) , physics , mathematics , finance , quantum mechanics , pure mathematics , programming language
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