Open AccessThe Effect of Ballistic Electron Transport on Copper-Niobium Thermal Interface Conductance
Author(s) -
Ramez Cheaito,
John C. Duda,
Thomas E. Beechem,
Jon F. Ihlefeld,
Khalid Hattar,
Edward S. Piekos,
Amit Misra,
Jon K. Baldwin,
Patrick E. Hopkins
Publication year - 2013
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1115/ht2013-17541
Subject(s) - ballistic conduction , materials science , thermal conductivity , niobium , copper , electron , conductance , thermal conduction , condensed matter physics , metal , electron transport chain , electrical resistivity and conductivity , thermal , resistor , composite material , thermodynamics , chemistry , metallurgy , physics , biochemistry , quantum mechanics , voltage
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