Open AccessSwift Reliability Test Methodology of 100G High-Speed, Energy-efficient Electro-Absorption Modulated Lasers (EML) for Green Datacenter Networks
Author(s) -
Jack JiaSheng Huang,
YuHeng Jan,
Jesse Chang,
Yi-Ching Hsu,
Daxi Ren,
Emin Chou
Publication year - 2016
Publication title -
studies in engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2330-2046
pISSN - 2330-2038
DOI - 10.11114/set.v3i1.1727
Subject(s) - transceiver , reliability (semiconductor) , ethernet , computer science , gigabit ethernet , efficient energy use , reliability engineering , embedded system , computer network , engineering , telecommunications , electrical engineering , wireless , physics , power (physics) , quantum mechanics
High-speed transceivers are receiving great interest due to the demand for huge data traffic and information storage capacities in the Big Data era. Recently, 100 Gigabit Ethernet (100GbE) has become an IEEE standardized data communication protocol. The 100G quad small form-factor pluggable (QSFP) transceiver is one of the key technological enablers in the high-speed optical networks. In this paper, we study the reliability current dependence for the four-lambda QSFP (4x25G) EML devices that are employed in the 100G QSFP transceivers. In order to meet the energy-efficient and environmental requirements, we develop a swift reliability test methodology that can provide fast, accurate reliability assessment to ensure robust long-term field performance. We discuss the acceleration factor and extrapolation for the energy-efficient reliability test.