Open AccessReflection Coefficient Measurement through the Implementation of Wideband Multi-Port Reflectometer with Error Correction for Microwave Imaging Application of Human Head
Author(s) -
Rashidah Che Yob,
Norhudah Seman
Publication year - 2013
Publication title -
jurnal teknologi/jurnal teknologi
Language(s) - English
Resource type - Journals
eISSN - 2180-3722
pISSN - 0127-9696
DOI - 10.11113/jt.v64.2072
Subject(s) - wideband , reflection coefficient , port (circuit theory) , microwave imaging , reflection (computer programming) , microwave , device under test , electronic engineering , optics , head (geology) , power dividers and directional couplers , computer science , acoustics , engineering , physics , telecommunications , programming language , geomorphology , geology
This article presents the reflection coefficient measurement by using a wideband multi-port reflectometer for microwave imaging application of human head. The configuration of the proposed wideband multi-port reflectometer is formed by passive components, which are four couplers and two power dividers operating from 1 to 6 GHz. The investigation is successfully done through simulation using the Agilent’s Advanced Design Systems (ADS) software and practical measurement in laboratory. An error correction method with three standards of match, open and short load is then applied to the constructed wideband multi-port reflectometer to remove its imperfect characteristics. The wideband characteristics of proposed reflectometer are analyzed and verified across the designated frequency band. Its operation in reflection coefficient is tested with the chosen device under test (DUT).