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Diffusing‐Wave Spectroscopy Contribution to Strain Analysis
Author(s) -
Erpelding M.,
Dollet B.,
Faisant A.,
Crassous J.,
Amon A.
Publication year - 2013
Publication title -
strain
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.477
H-Index - 47
eISSN - 1475-1305
pISSN - 0039-2103
DOI - 10.1111/str.12024
Subject(s) - spectroscopy , scattering , materials science , measure (data warehouse) , field (mathematics) , strain (injury) , sensitivity (control systems) , range (aeronautics) , light scattering , optics , computational physics , physics , composite material , computer science , electronic engineering , engineering , mathematics , medicine , quantum mechanics , database , pure mathematics
We present a new full‐field strain measurement method based on diffusing‐wave spectroscopy. Our technique makes it possible to measure strains in the vicinity of the surface of highly light‐scattering materials. Its main feature is an extreme sensitivity: the range of deformations measured is 10 −5 –10 −3 . To validate the measurements, experimental results from several plane stress configurations are compared with theoretical and numerical calculations. Furthermore, we propose an extension of the method for non‐scattering materials.