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Illumination conditions in microsphere‐assisted microscopy
Author(s) -
PERRIN STEPHANE,
LI HONGYU,
LEONGHOI AUDREY,
LECLER SYLVAIN,
MONTGOMERY PAUL
Publication year - 2019
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12781
Subject(s) - microscopy , optics , microsphere , optical microscope , materials science , diaphragm (acoustics) , resolution (logic) , white light , image resolution , focus (optics) , depth of field , bright field microscopy , microscope , optical transfer function , physics , computer science , scanning electron microscope , acoustics , artificial intelligence , loudspeaker , engineering , chemical engineering
Summary White‐light microsphere‐assisted microscopy is a full‐field and label‐free imaging promising technique making it possible to achieve a subdiffraction lateral resolution. However, performance of this technique depends not only on the geometrical parameters but also on the illumination conditions of the optical system. In the present work, experimental measurements and computer simulations have been performed in air in order to determine the influence of the two diaphragm apertures of the Köhler arrangement and the spectral width of the light source on both the depth‐of‐focus of the microsphere and the optimization of the imaging contrast. Furthermore, the super‐resolution phenomenon is demonstrated and the cumulated optical aberrations are shown through the measurement of the optical transfer function for the different arrangements of the illumination part.