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Enhanced spatial resolution in vector potential photoelectron microscopy
Author(s) -
BROWNING R.
Publication year - 2017
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12558
Subject(s) - resolution (logic) , x ray photoelectron spectroscopy , image resolution , electron microscope , cyclotron , electron , microscope , optics , work function , chemistry , materials science , physics , metal , nuclear magnetic resonance , quantum mechanics , artificial intelligence , computer science , organic chemistry
Summary The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution.