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Growth and characterization of V 2 O 5 thin film on conductive electrode
Author(s) -
MOLA GENENE T.,
ARBAB ELHADI A. A.,
TALEATU BIDINI A.,
KAVIYARASU K.,
AHMAD ISHAQ,
MAAZA M.
Publication year - 2017
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12490
Subject(s) - photoluminescence , materials science , thin film , pentoxide , diffraction , electrode , vanadium , absorption spectroscopy , analytical chemistry (journal) , quenching (fluorescence) , optoelectronics , optics , nanotechnology , fluorescence , chemistry , metallurgy , physics , chromatography
Summary Vanadium pentoxide V 2 O 5 thin films were grown at room temperature on ITO coated glass substrates by electrochemical deposition. The resulting films were annealed at 300, 400 and 500°C for 1 h in ambient environment. The effect of heat treatment on the films properties such as surface morphology, crystal structure, optical absorption and photoluminescence were investigated. The x‐ray diffraction study showed that the films are well crystallized with temperatures. Strong reflection from plane (400) indicated the film's preferred growth orientation. The V 2 O 5 films are found to be highly transparent across the visible spectrum and the measured photoluminescence quenching suggested the film's potential application in OPV device fabrication.