Premium
Reverse Monte Carlo reconstruction algorithm for discrete electron tomography based on HAADF‐STEM atom counting
Author(s) -
MOYON F.,
HERNANDEZMALDONADO D.,
ROBERTSON M.D.,
ETIENNE A.,
CASTRO C.,
LEFEBVRE W.
Publication year - 2017
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/jmi.12464
Subject(s) - scanning transmission electron microscopy , electron tomography , tilt (camera) , monte carlo method , atom (system on chip) , electron , dark field microscopy , optics , face (sociological concept) , transmission electron microscopy , physics , algorithm , computational physics , materials science , computer science , microscopy , geometry , mathematics , statistics , quantum mechanics , embedded system , social science , sociology
Summary In this paper, we propose an algorithm to obtain a three‐dimensional reconstruction of a single nanoparticle based on the method of atom counting. The location of atoms in three dimensions has been successfully performed using simulations of high‐angle‐annular‐dark‐field images from only three zone‐axis projections, [110], [310] and [211], for a face‐centred cubic particle. These three orientations are typically accessible by low‐tilt holders often used in high‐performance scanning transmission electron microscopes.